1.1 --- a/include/SDL_test_harness.h	Tue Aug 20 23:20:32 2013 -0400
     1.2 +++ b/include/SDL_test_harness.h	Wed Aug 21 09:43:09 2013 -0300
     1.3 @@ -43,30 +43,30 @@
     1.4  #endif
     1.5  
     1.6  
     1.7 -/*! Definitions for test case structures*/
     1.8 +/*! Definitions for test case structures */
     1.9  #define TEST_ENABLED  1
    1.10  #define TEST_DISABLED 0
    1.11  
    1.12 -/*! Definition of all the possible test return values of the test case method*/
    1.13 +/*! Definition of all the possible test return values of the test case method */
    1.14  #define TEST_ABORTED        -1
    1.15  #define TEST_STARTED         0
    1.16  #define TEST_COMPLETED       1
    1.17  #define TEST_SKIPPED         2
    1.18  
    1.19 -/*! Definition of all the possible test results for the harness*/
    1.20 +/*! Definition of all the possible test results for the harness */
    1.21  #define TEST_RESULT_PASSED              0
    1.22  #define TEST_RESULT_FAILED              1
    1.23  #define TEST_RESULT_NO_ASSERT           2
    1.24  #define TEST_RESULT_SKIPPED             3
    1.25  #define TEST_RESULT_SETUP_FAILURE       4
    1.26  
    1.27 -/*!< Function pointer to a test case setup function (run before every test)*/
    1.28 +/*!< Function pointer to a test case setup function (run before every test) */
    1.29  typedef void (*SDLTest_TestCaseSetUpFp)(void *arg);
    1.30  
    1.31 -/*!< Function pointer to a test case function*/
    1.32 +/*!< Function pointer to a test case function */
    1.33  typedef int (*SDLTest_TestCaseFp)(void *arg);
    1.34  
    1.35 -/*!< Function pointer to a test case teardown function (run after every test)*/
    1.36 +/*!< Function pointer to a test case teardown function (run after every test) */
    1.37  typedef void  (*SDLTest_TestCaseTearDownFp)(void *arg);
    1.38  
    1.39  /**